Flatbed scanners have emerged as promising devices for high-resolution, single-image material capture. However, existing approaches assume specific capture conditions that limit their scalability. This work introduces a method inspired by intrinsic image decomposition that removes shading and specularity, enabling material capture with standard flatbed scanners. It also extends single-image reflectance capture with opacity and transmittance estimation, key components of full material appearance for thin-layer materials such as fabrics.